| 2. | The microstructures and physics properties of the sbn films were characterized by xrd , afm , sims , raman scattering , and spectrophotometer , electrical induced birefringence etc . the effects of growth parameters on the quality of sbn films were discussed , such as substrates , annealing temperature , and precursor solution , bufferlayer ( ksbn , mgo ) 用x射线衍射仪( xrd ) 、原子力显微镜( afm ) 、二次离子质谱( sims ) 、受激拉曼散射、分光光度计、电致双折射(自建系统)等方法对sbn薄膜的结构性能和物理性能进行了表征。 |